Relaxation Phenomena in GaN/ AlN/ 6H-SiC Heterostructures
نویسندگان
چکیده
منابع مشابه
Self-consistent scattering analysis of Al0.2Ga0.8N/AlN/GaN/AlN heterostructures grown on 6H-SiC substrates using photo-Hall effect measurements
Hall effect measurements on undoped Al0.2Ga0.8N/AlN/GaN/AlN heterostructures grown on 6H-SiC substrates were carried out as a function of the temperature (30–300 K) and magnetic field (0–1.4 T). Measurements were carried out under dark and after-illumination conditions. After the dark measurements, the samples were illuminated with a blue light emitting diode for 30 min, and then the same measu...
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ژورنال
عنوان ژورنال: MRS Internet Journal of Nitride Semiconductor Research
سال: 1999
ISSN: 1092-5783
DOI: 10.1557/s1092578300002830